Skip to content Skip to navigation

Transmission Electron Microscope

JEOL JEM2011 Scanning Transmission Electron Microscope

This is a high-resolution transmission electron microscope (TEM) with an LaB6 filament and Gatan GIF camera with 1.6 eV energy resolution. This instrument is capable of 2.4 Å point-to-point image resolution and 1.4 Å lattice fringe resolution. The Gatan GIF provides for the collection of electron-energy loss spectra and maps, in either nanoprobe (10 nm) or TEM mode.

Electron energy-loss spectroscopy can be used for many purposes. It is highly sensitive to light elements and complements another TEM technique — energy dispersive X-ray spectroscopy — that is most commonly used for heavier elements. It can also be used to determine plasmon energy, band gap, coordination, oxidation state, and many other material characteristics at a spatial resolution of about 10 nm in the nanoprobe mode.

Soon, this instrument will have a cryo-transfer holder/stage and energy dispersive X-ray spectrometer.

Cryomicroscopy is useful for reducing damage rates, minimizing carbon contamination and in soft materials.

Training is availble for students, staff and faculty members.

See calendar HERE