Nexsa X-Ray Photoelectron Spectrometer
Nexus X-Ray Photoelectron Spectrometer (XPS)
A multi-analysis instrument capable of X-Ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, and Raman Spectroscopy for analysis of surface chemistry of various materials, such as insulators, semiconductors, and metals.
Features include: Insulator analysis, Small spot analysis, and Avantage Software for instrument control, data processing, and reporting
Specifications:
- X-ray Source Type: Monochromated, micro-focused, low power Al Ka X-ray source
- X-ray spot size: 10- 400 µm (adjustable in 5µm steps)
- Analyzer Type: 180°, double-focusing, hemispherical analyser with 128-channel detector
- Sampling Area: 3600 mm2
- Maximum sample thickness: 20 mm
- Depth profiling: EX06 monatomic ion source
- Vacuum System: 2 x 260 260 l.s-1 turbo molecular pumps, with automated titanium sublimation pump, and backing pump
Accessories: UPS, Raman spectrometer
- RAMAN: Spectroscopic technique used to in chemistry to provide a structural fingerprint
- UPS: Ultra-violet photoelectron spectroscopy refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region
